- Robust Device Test Interface for in-circuit and out-of-circuit IC testing
- Supports a wide range of IC devices (DIP, PLCC, PGA, SOIC)
- Enables programming, testing, identification, and comparison of ICs
- Supports counterfeit device detection
- Universal SOIC adaptor for flexible device handling
- Seamless integration with PinPoint test systems
Test Adaptors
Device Test Interface: Robust and reliable electrical contact for in-circuit and out-of-circuit test of ICs.
Astronic Test Adaptors provide a robust and reliable electrical interface for in-circuit and out-of-circuit IC testing. Designed for demanding environments, they support a wide range of device types including DIP, PLCC, PGA, and SOIC, enabling accurate programming, testing, identification, and counterfeit detection. Built with durable, precision-machined materials, these adaptors ensure long-term performance and seamless integration with PinPoint test systems for both production testing and development needs.
Features
Key capabilities and advantages
Specification
Technical specifications and parameters
| Construction | Precision-machined, high-durability material for long service life |
| Electrical Interface | Reliable and stable contact between test system and DUT |
| SOIC Support | 8 to 44 pins (wide and narrow body devices) |
| Compatibility | Designed for PinPoint test systems and P2-500-DIL test box |
| Application | Suitable for development, validation, and production testing environments |
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