- Robust and reliable electrical contact for IC testing
- Extensive range of Device Test Interfaces (DTIs)
- In-circuit and out-of-circuit test capability
- DTIs for fine pitch devices
- DTIs for through-hole devices
- DTIs for underside probing
- IC test and development adaptors for DIP, PLCC & PGA devices
- Universal test adaptors for Small Outline IC devices
- Custom DTIs available for varied package designs
- Superior to fragile commercial test clips
- Accommodates diverse package types
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Test Adaptors
Diagnosys Device Test Interface: Robust and reliable electrical contact for in-circuit and out-of-circuit test of ICs
A critical requirement for testing a component in-circuit is to ensure good electrical contact with the pins of the device being tested. Although there are many commercially available test clips, they are often fragile and limited to the more common device package types.
Features
Key capabilities and advantages
Specification
Technical specifications and parameters
| DTI Types | Device Test Interface for robust and reliable electrical contact |
| Package Support | Fine pitch devices, through-hole devices, underside probing |
| Standard Adaptors | IC test and development adaptors for DIP, PLCC & PGA devices |
| Universal Adaptors | Universal test adaptors for Small Outline IC devices |
| Custom Solutions | Custom DTIs available for varied and diverse package designs |
| Application | In-circuit and out-of-circuit test of ICs |
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