The HRE series comes in two different sizes to fit most DUTs and combine ultra-high scan resolution of 25 μm with probe head rotation, and the best-in-class scanning SW to deliver powerful visualization of the EMC test. An optional IC scan kit, with dedicated inspection camera and high resolution near-field probes, lets you even scan for emission and immunity hotspots inside an IC.
A complete scanner system consists of the EMC-Scanner Hardware package, the Detectus Scanning SW (DSS), a Spectrum Analyzer and a PC to run the scanner SW. Pendulum Instruments can supply everything if required, but normally the user already possesses a PC and a Spectrum Analyzer.
Using the EMC-Scanner during the early stages of design enables you to detect potential emission and immunity problems before they become integrated into the product and expensive to correct. If a product has failed a test at a test house, normally you only learn which frequency failed, not the location of the noise source. The EMC-Scanner can help you find the source, and repeated measurements while redesigning your product helps you lower the emission levels.
With 25 μm step size of the scanner, you can pinpoint emission sources in densely packed designs. You can even follow emission hot spots inside an IC, using the IC option.
The easy-to-use and feature-rich DSS SW let you measure and visualize the intensity and the location of a radiation source at a component level – or even inside a component. The results of such a measurement can be shown as two- or three-dimensional colored maps. The measurements can easily be repeated creating objective, comparative measurement results.